Elastic Diffuse Scattering Spectrometer
CORELLI | BL-9 | SNS
Beam Profiles and Spatial Distribution
| Top Row: from measurement | |
| Middle Row: from simulation | |
Measured spectra at the sample position (red) agree well with Monte Carlo simulation (black). | |
Powder diffraction pattern (silicon)
| Detector view of standard silicon powder sample at room temperature. | |
| A calibration done successfully on standard silicon powder sample. |
Cross Correlation on Vanadium Powder
| Before cross-correlation |
| After cross-correlation |
Single Crystal Measurements at Corelli
| (a) Before normalization | |
| Left panel: standard Nickel single crystal in the (0,k,l)scattering plane. | (b) After normalization |
| Right panel: comparison of the diffuse scattering pattern from Ca-stabilized ZrO2measured before summer outage. (a) before, and (b) after the normalization in the (H,K,0) scattering plane. (c) slice of (0,K,L) scattering plane with H=3.8 | (c) (O, K, L) plane, at H-3.8 |
Implement cross-correlation on single crystal diffraction data
Fe72Pt28 Invar crystal, T=10 K
Fe72Pt28 Invar crystal, T=200 K
10K – 200K data, note that cross-correlation is performed on the data to obtain elastic only signal.
Short range polaron correlation in single crystal of colossal magnetoresistance (CMR) La0.7Ca0.3MnO3 (mass ~ 2 grams, counting time ~ 30mins/each orientation, total of 19 angles), red arrow shows the short range structural diffuse scattering.
Antiferromagnetic order of the LaMnO3/SrMnO3 super-lattice thin film with thickness of 1000 Å, data collected around 30 minutes.
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