Contacts
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Neutron Scattering Scientist/Group Leader
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Instrument Scientist
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Instrument Scientist
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Instrument Scientist
To enable world-leading neutron reflectometry on complex interfaces by probing surface and interfacial structures on length scales from 0.5 nm to 350 nm, delivering transformative insights into the dynamics, function, and evolution of surfaces and thin films across the physical, chemical, biological, and materials sciences.
The Liquids Reflectometer measures specular and off specular neutron reflectivity in a horizontal sample geometry from solid surfaces, solid/liquid interfaces, and free liquid surfaces. Probe wavelength and flux constrain size and flatness to samples no smaller than about 1×1 cm2 deposited on atomically smooth and cm-scale flat substrates such as silicon, quartz, sapphire, or water. The most commonly used substrate is a 50-mm-diameter, 5-mm-thick silicon wafer. A variety of sample environments are supported, including an automated sample changer, temperature-controlled liquid/solid cells with liquid handling, potentiostatically controlled electrochemical cells, vacuum and gas-handling chambers, a rheometer, and a Langmuir trough. For specialized sample environments, the user should contact a beamline staff member. We are always open to new ideas and interested in developing new capabilities.
Researchers are using the LR to study a broad range of problems, including those in the following scientific fields
| Moderator | Coupled supercritical H2 |
| Bandwidth | 3.4 Å @ 60 Hz, 6.8 Å @ 30 Hz |
| Wavelength Range | 2.5 Å < λ < 17.0 Å |
| Resolution | 0.02 < δQ/Q < 0.10 |
| Sample Environment |
Examples include: Vacuum and multi-environment Chamber |
Neutron Scattering Scientist/Group Leader
Instrument Scientist
Instrument Scientist
Instrument Scientist
Oak Ridge National Laboratory is managed by UT-Battelle LLC for the US Department of Energy